This book addresses issues pertinent to stress generation, spanning from micrometer interconnects in solar photovoltaics (PV) to multilayers of nano-scale composites. Synchrotron X-ray diffraction is widely used to probe the stress/strain of the materials due to its distinct advantages. The technique is unique as it has the capabilities to quantitatively determine stresses, e.g. as in silicon and to map these stresses with a sub-micron resolution, all while the silicon cells are already encapsulated. Stress generation in material leads to failure and hence, reliability of the final product is directly affected. From the topics and various case studies covered in this book, the reader gets a know-how of where stress accumulates and how it can be quantified. Further this also helps in building better designs, which may avoid the current practiced trends.